Total ionizing dose effects on MOS transistors fabricated in 0.18 µm CMOS technology

Varvara Bezhenova, Alicja Malgorzata Michalowska-Forsyth

Institute of Electronics (4390)

Research output: Contribution to conference › Poster › peer-review

1 Poster presentation

1 results
- Title
- Start date(ascending)

Total ionizing dose effects on MOS transistors fabricated in 0.18 µm CMOS technology
Varvara Bezhenova (Speaker)
18 May 2016 → 21 May 2016
Activity: Talk or presentation › Poster presentation › Science to science