@inproceedings{bbb4f50791cb433d815525dea4893b95,
title = "A study of a measurement and simulation method on ESD noise causing soft-errors by disturbing signals",
abstract = "A methodology to measure and simulate ESD induced noise on active IC Pins is introduced. A simple experimental setup injects ESD noise from an ESD generator and captures the waveforms. Secondly, the waveforms are simulated using a combination of 3D simulation and SPICE modeling",
author = "Jongsung Lee and Jaedeok Lim and Cheolgu Jo and Byongsu Seol and Argha Nandy and Tianqi Li and David Pommerenke",
year = "2011",
month = nov,
day = "10",
language = "English",
isbn = "1585371971",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011",
note = "33rd Annual Electrical Overstress/Electrostatic Discharge Symposium : EOS/ESD 2011 ; Conference date: 11-09-2011 Through 16-09-2011",
}