Sources of analyte contamination and loss during the analytical process

Günter Knapp, Peter Schramel

Research output: Chapter in Book/Report/Conference proceedingChapterResearch

Original languageEnglish
Title of host publicationSample preparation for trace element analysis
Place of PublicationAmsterdam
PublisherElsevier B.V.
Pages23-45
Volume41
Edition1
ISBN (Print)0-444-51101-6
Publication statusPublished - 2003

Publication series

NameWilson & Wilson's comprehensive analytical chemistry
PublisherElsevier Science B.V.

Cite this

Knapp, G., & Schramel, P. (2003). Sources of analyte contamination and loss during the analytical process. In Sample preparation for trace element analysis (1 ed., Vol. 41, pp. 23-45). (Wilson & Wilson's comprehensive analytical chemistry). Amsterdam: Elsevier B.V..