Sources of analyte contamination and loss during the analytical process

Günter Knapp, Peter Schramel

Research output: Chapter in Book/Report/Conference proceedingChapterResearch

Original languageEnglish
Title of host publicationSample preparation for trace element analysis
Place of PublicationAmsterdam
PublisherElsevier B.V.
Pages23-45
Volume41
Edition1
ISBN (Print)0-444-51101-6
Publication statusPublished - 2003

Publication series

NameWilson & Wilson's comprehensive analytical chemistry
PublisherElsevier Science B.V.

Cite this

Knapp, G., & Schramel, P. (2003). Sources of analyte contamination and loss during the analytical process. In Sample preparation for trace element analysis (1 ed., Vol. 41, pp. 23-45). (Wilson & Wilson's comprehensive analytical chemistry). Amsterdam: Elsevier B.V..

Sources of analyte contamination and loss during the analytical process. / Knapp, Günter; Schramel, Peter.

Sample preparation for trace element analysis. Vol. 41 1. ed. Amsterdam : Elsevier B.V., 2003. p. 23-45 (Wilson & Wilson's comprehensive analytical chemistry).

Research output: Chapter in Book/Report/Conference proceedingChapterResearch

Knapp, G & Schramel, P 2003, Sources of analyte contamination and loss during the analytical process. in Sample preparation for trace element analysis. 1 edn, vol. 41, Wilson & Wilson's comprehensive analytical chemistry, Elsevier B.V., Amsterdam, pp. 23-45.
Knapp G, Schramel P. Sources of analyte contamination and loss during the analytical process. In Sample preparation for trace element analysis. 1 ed. Vol. 41. Amsterdam: Elsevier B.V. 2003. p. 23-45. (Wilson & Wilson's comprehensive analytical chemistry).
Knapp, Günter ; Schramel, Peter. / Sources of analyte contamination and loss during the analytical process. Sample preparation for trace element analysis. Vol. 41 1. ed. Amsterdam : Elsevier B.V., 2003. pp. 23-45 (Wilson & Wilson's comprehensive analytical chemistry).
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