Root Cause Analysis Methodology of ESD Soft-Failure Applied to a Robot

Abhishek Patnaik, Wei Zhang, Runbing Hua, Jun Fan, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A complex system such as a human assisting robot will have many sensors and use parallel processing for achieving the desired action. During a transient disturbance, such as an electrostatic discharge (ESD), one or many of these sensors can be disturbed. In this study, the detect/presence logic is toggled, consequently, the microcontroller reads the sensor status as disabled. This is a soft-failure which can be recovered by a power cycle of the system. Here a case study is investigated where a methodology is developed to help system designers to understand and model the cause of the sensor failure during an ESD event. This methodology will also help system designers to design efficient filters on the critical signal lines to minimize the effect of coupled noise.

Original languageEnglish
Title of host publication2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)9781538612415
DOIs
Publication statusPublished - 17 Oct 2018
Externally publishedYes
Event2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018 - Chengdu, China
Duration: 26 Mar 201828 Mar 2018

Publication series

Name2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018

Conference

Conference2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018
CountryChina
CityChengdu
Period26/03/1828/03/18

Keywords

  • Electrical fast transient (EFT)
  • Electrostatic discharge (ESD)
  • Loop impedance
  • Soft-failure
  • System level ESD
  • Tribo-charging

ASJC Scopus subject areas

  • Radiation
  • Electrical and Electronic Engineering
  • Computational Mathematics

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  • Cite this

    Patnaik, A., Zhang, W., Hua, R., Fan, J., & Pommerenke, D. (2018). Root Cause Analysis Methodology of ESD Soft-Failure Applied to a Robot. In 2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018 [8496642] (2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/COMPEM.2018.8496642