Root Cause Analysis Methodology of ESD Soft-Failure Applied to a Robot

Abhishek Patnaik, Wei Zhang, Runbing Hua, Jun Fan, David Pommerenke

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

A complex system such as a human assisting robot will have many sensors and use parallel processing for achieving the desired action. During a transient disturbance, such as an electrostatic discharge (ESD), one or many of these sensors can be disturbed. In this study, the detect/presence logic is toggled, consequently, the microcontroller reads the sensor status as disabled. This is a soft-failure which can be recovered by a power cycle of the system. Here a case study is investigated where a methodology is developed to help system designers to understand and model the cause of the sensor failure during an ESD event. This methodology will also help system designers to design efficient filters on the critical signal lines to minimize the effect of coupled noise.

Originalspracheenglisch
Titel2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
ISBN (elektronisch)9781538612415
DOIs
PublikationsstatusVeröffentlicht - 17 Okt 2018
Extern publiziertJa
Veranstaltung2018 IEEE International Conference on Computational Electromagnetics: ICCEM 2018 - Chengdu, China
Dauer: 26 Mär 201828 Mär 2018

Publikationsreihe

Name2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018

Konferenz

Konferenz2018 IEEE International Conference on Computational Electromagnetics
LandChina
OrtChengdu
Zeitraum26/03/1828/03/18

ASJC Scopus subject areas

  • !!Radiation
  • !!Electrical and Electronic Engineering
  • !!Computational Mathematics

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