@inproceedings{25b74bfedcb344fcb6df2958a4713c05,
title = "Powered system-level conductive TLP probing method for ESD/EMI hard fail and soft fail threshold evaluation",
abstract = "In this paper an advanced system-level TLP probing technique is presented to evaluate the ESD and EMI performance of a powered system applicable to high speed interfaces. It allows to detect hardware and software fail thresholds to assess the performance of an ESD/EMI protection solution. The method is demonstrated on a Intel mobile phone reference platform.",
author = "Thomas Schwingshackl and Benjamin Orr and Joost Willemen and Werner Simb{\"u}rger and Harald Gossner and Wolfgang B{\"o}sch and David Pommerenke",
year = "2013",
month = oct,
day = "16",
language = "English",
isbn = "9781585372324",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013",
note = "35th Annual Electrical Overstress/Electrostatic Discharge Symposium : EOS/ESD 2013 ; Conference date: 08-09-2013 Through 13-09-2013",
}