Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system

Roland Sleik, Michael Glavanovics, Klaus Krischan, Annette Mütze

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe)
Place of PublicationWarsaw
PublisherIEEE Xplore
Pages1-8
Publication statusPublished - 11 Sep 2017

Publication series

NameEuropean Conference on Power Electronics and Applications

Cite this

Sleik, R., Glavanovics, M., Krischan, K., & Mütze, A. (2017). Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system. In Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe) (pp. 1-8). (European Conference on Power Electronics and Applications ). Warsaw: IEEE Xplore.