Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system

Roland Sleik, Michael Glavanovics, Klaus Krischan, Annette Mütze

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe)
Place of PublicationWarsaw
PublisherIEEE Xplore
Pages1-8
Publication statusPublished - 11 Sep 2017

Publication series

NameEuropean Conference on Power Electronics and Applications

Cite this

Sleik, R., Glavanovics, M., Krischan, K., & Mütze, A. (2017). Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system. In Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe) (pp. 1-8). (European Conference on Power Electronics and Applications ). Warsaw: IEEE Xplore.

Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system. / Sleik, Roland; Glavanovics, Michael; Krischan, Klaus; Mütze, Annette.

Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe). Warsaw : IEEE Xplore, 2017. p. 1-8 (European Conference on Power Electronics and Applications ).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Sleik, R, Glavanovics, M, Krischan, K & Mütze, A 2017, Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system. in Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe). European Conference on Power Electronics and Applications , IEEE Xplore, Warsaw, pp. 1-8.
Sleik R, Glavanovics M, Krischan K, Mütze A. Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system. In Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe). Warsaw: IEEE Xplore. 2017. p. 1-8. (European Conference on Power Electronics and Applications ).
Sleik, Roland ; Glavanovics, Michael ; Krischan, Klaus ; Mütze, Annette. / Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system. Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe). Warsaw : IEEE Xplore, 2017. pp. 1-8 (European Conference on Power Electronics and Applications ).
@inproceedings{6bceddcb59e64eea993547b5b72c3b90,
title = "Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system",
author = "Roland Sleik and Michael Glavanovics and Klaus Krischan and Annette M{\"u}tze",
year = "2017",
month = "9",
day = "11",
language = "English",
series = "European Conference on Power Electronics and Applications",
publisher = "IEEE Xplore",
pages = "1--8",
booktitle = "Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe)",

}

TY - GEN

T1 - Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system

AU - Sleik, Roland

AU - Glavanovics, Michael

AU - Krischan, Klaus

AU - Mütze, Annette

PY - 2017/9/11

Y1 - 2017/9/11

M3 - Conference contribution

T3 - European Conference on Power Electronics and Applications

SP - 1

EP - 8

BT - Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe)

PB - IEEE Xplore

CY - Warsaw

ER -