Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system

Roland Sleik, Michael Glavanovics, Klaus Krischan, Annette Mütze

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe)
Place of Publication	Warsaw
Publisher	IEEE Xplore
Pages	1-8
Publication status	Published - 11 Sept 2017

Name	European Conference on Power Electronics and Applications

Cite this

Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system. / Sleik, Roland; Glavanovics, Michael; Krischan, Klaus et al.
Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe). Warsaw: IEEE Xplore, 2017. p. 1-8 (European Conference on Power Electronics and Applications ).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Sleik, Roland ; Glavanovics, Michael ; Krischan, Klaus et al. / Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system. Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe). Warsaw : IEEE Xplore, 2017. pp. 1-8 (European Conference on Power Electronics and Applications ).

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