Optical tracking based EM-field probing system for EMC near field manual scanning

Hui He; Pratik Maheshwari; David Pommerenke

doi:10.1109/ISEMC.2014.6899058

Optical tracking based EM-field probing system for EMC near field manual scanning

Hui He, Pratik Maheshwari, David Pommerenke

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

This paper introduces a method to visualize the frequency dependent electromagnetic field distribution on complex shaped electronic systems. This is achieved by combining magnetic field probing with an optical tracking system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved by manually instead of robotically. With the location from the optical tracking system, 3D near field strength map can be obtained at real time during near field manual scanning.

Original language	English
Title of host publication	2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)
Pages	697-701
Number of pages	5
DOIs	https://doi.org/10.1109/ISEMC.2014.6899058
Publication status	Published - 15 Sept 2014
Externally published	Yes
Event	2014 IEEE International Symposium on Electromagnetic Compatibility: EMC 2014 - Raleigh, United States Duration: 3 Aug 2014 → 8 Aug 2014

Conference

Conference	2014 IEEE International Symposium on Electromagnetic Compatibility
Country/Territory	United States
City	Raleigh
Period	3/08/14 → 8/08/14

Keywords

manual scan
near field scanning
near field visualization
Optical tracking

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/ISEMC.2014.6899058

Cite this

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title = "Optical tracking based EM-field probing system for EMC near field manual scanning",

abstract = "This paper introduces a method to visualize the frequency dependent electromagnetic field distribution on complex shaped electronic systems. This is achieved by combining magnetic field probing with an optical tracking system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved by manually instead of robotically. With the location from the optical tracking system, 3D near field strength map can be obtained at real time during near field manual scanning.",

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language = "English",

pages = "697--701",

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AU - Maheshwari, Pratik

AU - Pommerenke, David

PY - 2014/9/15

Y1 - 2014/9/15

N2 - This paper introduces a method to visualize the frequency dependent electromagnetic field distribution on complex shaped electronic systems. This is achieved by combining magnetic field probing with an optical tracking system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved by manually instead of robotically. With the location from the optical tracking system, 3D near field strength map can be obtained at real time during near field manual scanning.

AB - This paper introduces a method to visualize the frequency dependent electromagnetic field distribution on complex shaped electronic systems. This is achieved by combining magnetic field probing with an optical tracking system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved by manually instead of robotically. With the location from the optical tracking system, 3D near field strength map can be obtained at real time during near field manual scanning.

KW - manual scan

KW - near field scanning

KW - near field visualization

KW - Optical tracking

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M3 - Conference paper

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BT - 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)

T2 - 2014 IEEE International Symposium on Electromagnetic Compatibility

Y2 - 3 August 2014 through 8 August 2014

ER -

Optical tracking based EM-field probing system for EMC near field manual scanning

Abstract

Conference

Keywords

ASJC Scopus subject areas

Access to Document

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Cite this