Optical tracking based EM-field probing system for EMC near field manual scanning

Hui He, Pratik Maheshwari, David Pommerenke

Research output: Contribution to journalConference article

Abstract

This paper introduces a method to visualize the frequency dependent electromagnetic field distribution on complex shaped electronic systems. This is achieved by combining magnetic field probing with an optical tracking system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved by manually instead of robotically. With the location from the optical tracking system, 3D near field strength map can be obtained at real time during near field manual scanning.

Original languageEnglish
Article number6899058
Pages (from-to)697-701
Number of pages5
JournalIEEE International Symposium on Electromagnetic Compatibility
Volume2014-September
Issue numberSeptember
DOIs
Publication statusPublished - 15 Sep 2014
Externally publishedYes
Event2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014 - Raleigh, United States
Duration: 3 Aug 20148 Aug 2014

Keywords

  • manual scan
  • near field scanning
  • near field visualization
  • Optical tracking

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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