Optical tracking based EM-field probing system for EMC near field manual scanning

Hui He, Pratik Maheshwari, David Pommerenke

Publikation: Beitrag in einer FachzeitschriftKonferenzartikel

Abstract

This paper introduces a method to visualize the frequency dependent electromagnetic field distribution on complex shaped electronic systems. This is achieved by combining magnetic field probing with an optical tracking system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved by manually instead of robotically. With the location from the optical tracking system, 3D near field strength map can be obtained at real time during near field manual scanning.

Originalspracheenglisch
Aufsatznummer6899058
Seiten (von - bis)697-701
Seitenumfang5
FachzeitschriftIEEE International Symposium on Electromagnetic Compatibility
Jahrgang2014-September
AusgabenummerSeptember
DOIs
PublikationsstatusVeröffentlicht - 15 Sep 2014
Extern publiziertJa
Veranstaltung2014 IEEE International Symposium on Electromagnetic Compatibility: EMC 2014 - Raleigh, USA / Vereinigte Staaten
Dauer: 3 Aug 20148 Aug 2014

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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