TY - JOUR
T1 - Latch-up Detection During ESD Soft Failure Characterization Using an On-Die Power Sensor
AU - Maghlakelidze, Giorgi
AU - Gossner, Harald
AU - Pommerenke, David Johannes
PY - 2019
Y1 - 2019
N2 - ESD-induced latch up is detected with an on-die energy counter circuit. Raw values are accessed through a Linux operating system kernel call, then the power consumption is calculated. Persistent power consumption increase indicates the latch-up occurrence, thus avoiding the need of external equipment for its detection. The failure mode is not visually noticeable and requires full power cycling to fully recover
AB - ESD-induced latch up is detected with an on-die energy counter circuit. Raw values are accessed through a Linux operating system kernel call, then the power consumption is calculated. Persistent power consumption increase indicates the latch-up occurrence, thus avoiding the need of external equipment for its detection. The failure mode is not visually noticeable and requires full power cycling to fully recover
U2 - 10.1109/LEMCPA.2020.2972071
DO - 10.1109/LEMCPA.2020.2972071
M3 - Article
SN - 2637-6423
VL - 1
SP - 67
EP - 71
JO - IEEE Letters on Electromagnetic Compatibility Practice and Applications
JF - IEEE Letters on Electromagnetic Compatibility Practice and Applications
IS - 3
ER -