Latch-up Detection During ESD Soft Failure Characterization Using an On-Die Power Sensor

Giorgi Maghlakelidze; Harald Gossner; David Johannes Pommerenke

doi:10.1109/LEMCPA.2020.2972071

Latch-up Detection During ESD Soft Failure Characterization Using an On-Die Power Sensor

Giorgi Maghlakelidze, Harald Gossner, David Johannes Pommerenke

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Abstract

ESD-induced latch up is detected with an on-die energy counter circuit. Raw values are accessed through a Linux operating system kernel call, then the power consumption is calculated. Persistent power consumption increase indicates the latch-up occurrence, thus avoiding the need of external equipment for its detection. The failure mode is not visually noticeable and requires full power cycling to fully recover

Originalsprache	englisch
Seiten (von - bis)	67-71
Fachzeitschrift	IEEE Letters on Electromagnetic Compatibility Practice and Applications
Jahrgang	1
Ausgabenummer	3
DOIs	https://doi.org/10.1109/LEMCPA.2020.2972071
Publikationsstatus	Veröffentlicht - 2019
Extern publiziert	Ja

Zugriff auf Dokument

10.1109/LEMCPA.2020.2972071

https://ieeexplore.ieee.org/document/8986635

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title = "Latch-up Detection During ESD Soft Failure Characterization Using an On-Die Power Sensor",

abstract = "ESD-induced latch up is detected with an on-die energy counter circuit. Raw values are accessed through a Linux operating system kernel call, then the power consumption is calculated. Persistent power consumption increase indicates the latch-up occurrence, thus avoiding the need of external equipment for its detection. The failure mode is not visually noticeable and requires full power cycling to fully recover",

author = "Giorgi Maghlakelidze and Harald Gossner and Pommerenke, {David Johannes}",

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AB - ESD-induced latch up is detected with an on-die energy counter circuit. Raw values are accessed through a Linux operating system kernel call, then the power consumption is calculated. Persistent power consumption increase indicates the latch-up occurrence, thus avoiding the need of external equipment for its detection. The failure mode is not visually noticeable and requires full power cycling to fully recover

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DO - 10.1109/LEMCPA.2020.2972071

M3 - Article

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JO - IEEE Letters on Electromagnetic Compatibility Practice and Applications

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