Latch-up Detection During ESD Soft Failure Characterization Using an On-Die Power Sensor

Giorgi Maghlakelidze, Harald Gossner, David Johannes Pommerenke

Publikation: Beitrag in einer FachzeitschriftArtikel

Abstract

ESD-induced latch up is detected with an on-die energy counter circuit. Raw values are accessed through a Linux operating system kernel call, then the power consumption is calculated. Persistent power consumption increase indicates the latch-up occurrence, thus avoiding the need of external equipment for its detection. The failure mode is not visually noticeable and requires full power cycling to fully recover
Originalspracheenglisch
Seiten (von - bis)67-71
FachzeitschriftIEEE Letters on Electromagnetic Compatibility Practice and Applications
Jahrgang1
Ausgabenummer3
DOIs
PublikationsstatusVeröffentlicht - 2019
Extern publiziertJa

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