In-situ X-ray characterisation of voltage induced changes in organic semiconductors

Alfred Neuhold, Jiri Novak, Heinz-Georg Flesch, Souren Grigorian, Linda Grodd, Ulrich Pietsch, Roland Resel

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2010
Event10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP) - Warwick (UK)
Duration: 20 Sep 201023 Sep 2010

Conference

Conference10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP)
CityWarwick (UK)
Period20/09/1023/09/10

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

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