In-situ X-ray characterisation of voltage induced changes in organic semiconductors

Alfred Neuhold, Jiri Novak, Heinz-Georg Flesch, Souren Grigorian, Linda Grodd, Ulrich Pietsch, Roland Resel

Publikation: KonferenzbeitragPosterForschung

Originalspracheenglisch
PublikationsstatusVeröffentlicht - 2010
Veranstaltung10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP) - Warwick (UK)
Dauer: 20 Sep 201023 Sep 2010

Konferenz

Konferenz10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP)
OrtWarwick (UK)
Zeitraum20/09/1023/09/10

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Dies zitieren

Neuhold, A., Novak, J., Flesch, H-G., Grigorian, S., Grodd, L., Pietsch, U., & Resel, R. (2010). In-situ X-ray characterisation of voltage induced changes in organic semiconductors. Postersitzung präsentiert bei 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP), Warwick (UK), .

In-situ X-ray characterisation of voltage induced changes in organic semiconductors. / Neuhold, Alfred; Novak, Jiri; Flesch, Heinz-Georg; Grigorian, Souren; Grodd, Linda; Pietsch, Ulrich; Resel, Roland.

2010. Postersitzung präsentiert bei 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP), Warwick (UK), .

Publikation: KonferenzbeitragPosterForschung

Neuhold, A, Novak, J, Flesch, H-G, Grigorian, S, Grodd, L, Pietsch, U & Resel, R 2010, 'In-situ X-ray characterisation of voltage induced changes in organic semiconductors', Warwick (UK), 20/09/10 - 23/09/10, .
Neuhold A, Novak J, Flesch H-G, Grigorian S, Grodd L, Pietsch U et al. In-situ X-ray characterisation of voltage induced changes in organic semiconductors. 2010. Postersitzung präsentiert bei 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP), Warwick (UK), .
Neuhold, Alfred ; Novak, Jiri ; Flesch, Heinz-Georg ; Grigorian, Souren ; Grodd, Linda ; Pietsch, Ulrich ; Resel, Roland. / In-situ X-ray characterisation of voltage induced changes in organic semiconductors. Postersitzung präsentiert bei 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP), Warwick (UK), .
@conference{c3394ae097ae4ffa99e626d621fac94f,
title = "In-situ X-ray characterisation of voltage induced changes in organic semiconductors",
author = "Alfred Neuhold and Jiri Novak and Heinz-Georg Flesch and Souren Grigorian and Linda Grodd and Ulrich Pietsch and Roland Resel",
year = "2010",
language = "English",
note = "10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP) ; Conference date: 20-09-2010 Through 23-09-2010",

}

TY - CONF

T1 - In-situ X-ray characterisation of voltage induced changes in organic semiconductors

AU - Neuhold, Alfred

AU - Novak, Jiri

AU - Flesch, Heinz-Georg

AU - Grigorian, Souren

AU - Grodd, Linda

AU - Pietsch, Ulrich

AU - Resel, Roland

PY - 2010

Y1 - 2010

UR - http://www2.warwick.ac.uk/fac/sci/physics/research/condensedmatt/ferroelectrics/xtop2010

M3 - Poster

ER -