In-situ X-ray characterisation of voltage induced changes in organic semiconductors

Alfred Neuhold, Jiri Novak, Heinz-Georg Flesch, Souren Grigorian, Linda Grodd, Ulrich Pietsch, Roland Resel

Publikation: Konferenzbeitrag › Poster

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2010
Veranstaltung	10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP) - Warwick (UK) Dauer: 20 Sept. 2010 → 23 Sept. 2010

Konferenz	10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP)
Ort	Warwick (UK)
Zeitraum	20/09/10 → 23/09/10

Treatment code (Nähere Zuordnung)

@conference{c3394ae097ae4ffa99e626d621fac94f,

title = "In-situ X-ray characterisation of voltage induced changes in organic semiconductors",

author = "Alfred Neuhold and Jiri Novak and Heinz-Georg Flesch and Souren Grigorian and Linda Grodd and Ulrich Pietsch and Roland Resel",

year = "2010",

language = "English",

note = "10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP) ; Conference date: 20-09-2010 Through 23-09-2010",

}

TY - CONF

T1 - In-situ X-ray characterisation of voltage induced changes in organic semiconductors

AU - Neuhold, Alfred

AU - Novak, Jiri

AU - Flesch, Heinz-Georg

AU - Grigorian, Souren

AU - Grodd, Linda

AU - Pietsch, Ulrich

AU - Resel, Roland

PY - 2010

Y1 - 2010

UR - http://www2.warwick.ac.uk/fac/sci/physics/research/condensedmatt/ferroelectrics/xtop2010

M3 - Poster

T2 - 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP)

Y2 - 20 September 2010 through 23 September 2010

ER -