In situ testing of soft materials in the Environmental Scanning Electron Microscope

Research output: Chapter in Book/Report/Conference proceedingConference paper

Original languageEnglish
Title of host publicationInternational Conference on Electron Microscopy and Annual Meeting of the Electron Microscope Society
Publisher.
Pages24-25
Publication statusPublished - 2014
EventInternational Conference on Electron Microscopy and Annual Meeting of the Electron Microscope Society - New Delhi, India
Duration: 9 Jul 201411 Jul 2014

Conference

ConferenceInternational Conference on Electron Microscopy and Annual Meeting of the Electron Microscope Society
CountryIndia
CityNew Delhi
Period9/07/1411/07/14

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this