Impact of ESD generator parameters on failure level in fast CMOS system

Kai Wang, David Pommerenke*, Ramachandran Chundru, Jiusheng Huang, Kai Xiao, Ponniah Ilavarasan, Mike Schaffer

*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

Fingerprint

Dive into the research topics of 'Impact of ESD generator parameters on failure level in fast CMOS system'. Together they form a unique fingerprint.

Engineering

Mathematics