TY - GEN
T1 - Developing a universal exchange format for near-field scan data
AU - Shepherd, John
AU - Nakamura, Atsushi
AU - Lafon, Frederic
AU - Sicard, Etienne
AU - Ramdani, Mohamed
AU - Pommerenke, David
AU - Muchaidze, Giorgi
AU - Serpaud, Sebastien
PY - 2009/12/1
Y1 - 2009/12/1
N2 - Near-field scan measurements and simulations generate a large amount of data. The format of the data is closely linked to the supplier of the acquisition or simulation software, rendering extremely difficult its exchange between suppliers, customers, EDA tool vendors, academics, etc. The paper describes how a universal exchange format for near-field scan data has been developed. The format caters for various coordinate systems and is suited to emission and immunity testing both in the frequency and time domains.
AB - Near-field scan measurements and simulations generate a large amount of data. The format of the data is closely linked to the supplier of the acquisition or simulation software, rendering extremely difficult its exchange between suppliers, customers, EDA tool vendors, academics, etc. The paper describes how a universal exchange format for near-field scan data has been developed. The format caters for various coordinate systems and is suited to emission and immunity testing both in the frequency and time domains.
UR - http://www.scopus.com/inward/record.url?scp=74349098071&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2009.5284701
DO - 10.1109/ISEMC.2009.5284701
M3 - Conference paper
AN - SCOPUS:74349098071
SN - 9781424442676
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 177
EP - 182
BT - 2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009
T2 - 2009 IEEE International Symposium on Electromagnetic Compatibility
Y2 - 17 August 2009 through 21 August 2009
ER -