A study of a measurement and simulation method on ESD noise causing soft-errors by disturbing signals

Jongsung Lee*, Jaedeok Lim, Cheolgu Jo, Byongsu Seol, Argha Nandy, Tianqi Li, David Pommerenke

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paper

Abstract

A methodology to measure and simulate ESD induced noise on active IC Pins is introduced. A simple experimental setup injects ESD noise from an ESD generator and captures the waveforms. Secondly, the waveforms are simulated using a combination of 3D simulation and SPICE modeling

Original languageEnglish
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011
Publication statusPublished - 10 Nov 2011
Externally publishedYes
Event2011 33rd Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2011 - Anaheim, CA, United States
Duration: 11 Sep 201116 Sep 2011

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159

Conference

Conference2011 33rd Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2011
CountryUnited States
CityAnaheim, CA
Period11/09/1116/09/11

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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