A study of a measurement and simulation method on ESD noise causing soft-errors by disturbing signals

Jongsung Lee; Jaedeok Lim; Cheolgu Jo; Byongsu Seol; Argha Nandy; Tianqi Li; David Pommerenke

A study of a measurement and simulation method on ESD noise causing soft-errors by disturbing signals

Jongsung Lee^*, Jaedeok Lim, Cheolgu Jo, Byongsu Seol, Argha Nandy, Tianqi Li, David Pommerenke

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

A methodology to measure and simulate ESD induced noise on active IC Pins is introduced. A simple experimental setup injects ESD noise from an ESD generator and captures the waveforms. Secondly, the waveforms are simulated using a combination of 3D simulation and SPICE modeling

Original language	English
Title of host publication	Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011
Publication status	Published - 10 Nov 2011
Externally published	Yes
Event	33rd Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 2011 - Anaheim, United States Duration: 11 Sept 2011 → 16 Sept 2011

Publication series

Name	Electrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)	0739-5159

Conference

Conference	33rd Annual Electrical Overstress/Electrostatic Discharge Symposium
Country/Territory	United States
City	Anaheim
Period	11/09/11 → 16/09/11

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

A study of a measurement and simulation method on ESD noise causing soft-errors by disturbing signals. / Lee, Jongsung; Lim, Jaedeok; Jo, Cheolgu et al.
Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011. 2011. 6045600 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Lee, J, Lim, J, Jo, C, Seol, B, Nandy, A, Li, T & Pommerenke, D 2011, A study of a measurement and simulation method on ESD noise causing soft-errors by disturbing signals. in Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011., 6045600, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 33rd Annual Electrical Overstress/Electrostatic Discharge Symposium, Anaheim, California, United States, 11/09/11.

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AU - Nandy, Argha

AU - Li, Tianqi

AU - Pommerenke, David

PY - 2011/11/10

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SN - 9781585371976

T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

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T2 - 33rd Annual Electrical Overstress/Electrostatic Discharge Symposium

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A study of a measurement and simulation method on ESD noise causing soft-errors by disturbing signals

Abstract

Publication series

Conference

ASJC Scopus subject areas

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