3D Elemental Mapping using X-Ray Spectrometry in a Dual Beam-Focused Ion

Julian Wagner, Miroslava Schaffer, Mario Schmied, H. Mulders, M. Novak

Research output: Contribution to conference(Old data) Lecture or Presentation

Original languageEnglish
Publication statusPublished - 30 Jul 2006
EventMicroscopy & Microanalysis - Chicago, United States
Duration: 30 Jul 20063 Aug 2006

Conference

ConferenceMicroscopy & Microanalysis
CountryUnited States
CityChicago
Period30/07/063/08/06

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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