Characterization of the interface between Pt and NiO in a coulometric titration cell

The interface between a Pt-layer and a NiO crystal as part of a coulometric titration cell is characterized by analytical electron microscopy. In TEM-investigations an unkown interface structure was found which was characterized in detail. In addition to elemental distribution maps which were acquired using EFTEM, electron energy-loss spectra (EELS-linescan) were acquired across the interface to obtain quantitative compositional profiles. The following interfacial layers could be identified, all of which containing Pt, Ni and O in different proportions: 13 nm Pt-rich, 32 nm Ni-rich and 29 nm Pt-rich.