Material Science
Transistor
100%
Electronic Circuit
83%
Field Effect Transistor
75%
Oxide Compound
72%
Single Crystal
66%
Silicon
66%
Organic Field Effect Transistors
58%
Metal-Oxide-Semiconductor Field-Effect Transistor
50%
Capacitor
44%
Charge Carrier
44%
Electron Transfer
33%
Current Voltage Characteristics
33%
Self Assembled Monolayer
33%
Sheet Molding Compounds
33%
Carbon Nanotube
33%
Capacitance
33%
Semiconductor Device
33%
Silicon Wafer
30%
Carrier Concentration
29%
Nanotube
27%
Dielectric Material
27%
Carrier Mobility
27%
Scanning Electron Microscopy
25%
Free Volume
25%
Electrical Resistivity
20%
Self Assembly
16%
Crystal Structure
16%
Radiation Damage
16%
Silicon Carbide
16%
Doping (Additives)
16%
Resonator
16%
Film
16%
Al2O3
16%
Aluminum
16%
Organic Solar Cells
16%
Polymer Matrix
16%
Defect Structure
16%
Thin-Film Transistor
16%
Hydrogen Bonding
16%
Lamellar Structure
16%
Boron
16%
Transfer Process
16%
Solid Phase Epitaxy
16%
Packaging Material
16%
Chemical Vapor Deposition
16%
Fourier Transform Infrared Spectroscopy
16%
Oxidation Reaction
16%
Dielectric Property
16%
Activation Energy
13%
Bicrystal
11%
Engineering
Defects
50%
Single Electron
33%
Metal-Oxide-Semiconductor Field-Effect Transistor
33%
Bipolar Transistor
25%
Conductance Peak
16%
Oxide Layer
16%
Drain Electrode
16%
Nanoscale
16%
Logic Circuit
16%
Quantum Superposition
16%
Nanoelectronics
16%
Low-Temperature
16%
Recombination Centre
16%
Charge Transfer Salt
16%
Moisture Concentration
16%
Induced Defect
16%
Carrier Concentration
16%
Defect Structure
16%
Radiation Effect
16%
Doping Level
16%
Reverse Bias
16%
Breakdown Voltage
16%
Space Charge Region
16%
Process Simulation
16%
Transfer Molding
16%
Package Design
16%
Onset Temperature
16%
Phototransistor
16%
Dangling Bond
16%
Negative Differential Resistance
16%
Silicon Layer
16%
Si Substrate
16%
Bulk Silicon
16%
Monocrystalline Silicon
16%
Cryogenic Temperature
16%
Quantum Computer
16%
Dielectrics
16%
Process Zone
11%
Pn Junction
11%
Healing Process
11%
Bicrystal
11%
Lithography
8%
Capacitive Coupling
8%
Single Chip
8%
Application Performance
8%
Plasticisation
8%
Sample Temperature
8%
Potentiostat
8%
Nanometre
8%
Optoelectronics
8%