Electron Microscopy:Application to Semiconductor Materials and Device Characterization

Schröttner, H. (Speaker)

Activity: Talk or presentationPublic lecture or debateScience to public

Description

Talk: Electron Microscopy:Application to Semiconductor Materials and Device Characterization
Period11 Dec 2007
Event titleInstitutspräsentation für Fa. NXP Semiconductors
Event typeOther