Phase-Resolved Near-Field Scan Over Random Fields

Tianqi Li; Victor Khilkevich; David Pommerenke

doi:10.1109/TEMC.2016.2517651

Phase-Resolved Near-Field Scan Over Random Fields

Tianqi Li, Victor Khilkevich, David Pommerenke

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Abstract

This letter discusses an averaging technique for phase-resolved scanning of the fields generated by multiple uncorrelated stochastic sources. This method can separate the field contribution of each noise source into the resulting field patterns as if the sources that are not of interest were turned off. The scanned data can be used to localize the emission sources and to calculate the far-field pattern and total radiated power.

Originalsprache	englisch
Aufsatznummer	7412710
Seiten (von - bis)	506-511
Seitenumfang	6
Fachzeitschrift	IEEE Transactions on Electromagnetic Compatibility
Jahrgang	58
Ausgabenummer	2
DOIs	https://doi.org/10.1109/TEMC.2016.2517651
Publikationsstatus	Veröffentlicht - 1 Apr. 2016
Extern publiziert	Ja

ASJC Scopus subject areas

Atom- und Molekularphysik sowie Optik
Physik der kondensierten Materie
Elektrotechnik und Elektronik

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@article{68cc62abfd8c4bf38afdad9edcd61044,

title = "Phase-Resolved Near-Field Scan Over Random Fields",

abstract = "This letter discusses an averaging technique for phase-resolved scanning of the fields generated by multiple uncorrelated stochastic sources. This method can separate the field contribution of each noise source into the resulting field patterns as if the sources that are not of interest were turned off. The scanned data can be used to localize the emission sources and to calculate the far-field pattern and total radiated power.",

keywords = "Electromagnetic compatibility, emission source microscopy, far field, near-field scan, random fields",

author = "Tianqi Li and Victor Khilkevich and David Pommerenke",

year = "2016",

month = apr,

day = "1",

doi = "10.1109/TEMC.2016.2517651",

language = "English",

volume = "58",

pages = "506--511",

journal = "IEEE Transactions on Electromagnetic Compatibility",

issn = "0018-9375",

publisher = "Institute of Electrical and Electronics Engineers",

number = "2",

}

TY - JOUR

T1 - Phase-Resolved Near-Field Scan Over Random Fields

AU - Li, Tianqi

AU - Khilkevich, Victor

AU - Pommerenke, David

PY - 2016/4/1

Y1 - 2016/4/1

N2 - This letter discusses an averaging technique for phase-resolved scanning of the fields generated by multiple uncorrelated stochastic sources. This method can separate the field contribution of each noise source into the resulting field patterns as if the sources that are not of interest were turned off. The scanned data can be used to localize the emission sources and to calculate the far-field pattern and total radiated power.

AB - This letter discusses an averaging technique for phase-resolved scanning of the fields generated by multiple uncorrelated stochastic sources. This method can separate the field contribution of each noise source into the resulting field patterns as if the sources that are not of interest were turned off. The scanned data can be used to localize the emission sources and to calculate the far-field pattern and total radiated power.

KW - Electromagnetic compatibility

KW - emission source microscopy

KW - far field

KW - near-field scan

KW - random fields

UR - http://www.scopus.com/inward/record.url?scp=84976240539&partnerID=8YFLogxK

U2 - 10.1109/TEMC.2016.2517651

DO - 10.1109/TEMC.2016.2517651

M3 - Article

AN - SCOPUS:84976240539

SN - 0018-9375

VL - 58

SP - 506

EP - 511

JO - IEEE Transactions on Electromagnetic Compatibility

JF - IEEE Transactions on Electromagnetic Compatibility

IS - 2

M1 - 7412710

ER -

Phase-Resolved Near-Field Scan Over Random Fields

Abstract

ASJC Scopus subject areas

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