Phase-Resolved Near-Field Scan Over Random Fields

Tianqi Li, Victor Khilkevich, David Pommerenke

Publikation: Beitrag in einer FachzeitschriftArtikel

Abstract

This letter discusses an averaging technique for phase-resolved scanning of the fields generated by multiple uncorrelated stochastic sources. This method can separate the field contribution of each noise source into the resulting field patterns as if the sources that are not of interest were turned off. The scanned data can be used to localize the emission sources and to calculate the far-field pattern and total radiated power.

Originalspracheenglisch
Aufsatznummer7412710
Seiten (von - bis)506-511
Seitenumfang6
FachzeitschriftIEEE Transactions on Electromagnetic Compatibility
Jahrgang58
Ausgabenummer2
DOIs
PublikationsstatusVeröffentlicht - 1 Apr 2016
Extern publiziertJa

ASJC Scopus subject areas

  • !!Atomic and Molecular Physics, and Optics
  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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