Phase-Resolved Near-Field Scan Over Random Fields

Tianqi Li, Victor Khilkevich, David Pommerenke

Research output: Contribution to journalArticle

Abstract

This letter discusses an averaging technique for phase-resolved scanning of the fields generated by multiple uncorrelated stochastic sources. This method can separate the field contribution of each noise source into the resulting field patterns as if the sources that are not of interest were turned off. The scanned data can be used to localize the emission sources and to calculate the far-field pattern and total radiated power.

Original languageEnglish
Article number7412710
Pages (from-to)506-511
Number of pages6
JournalIEEE Transactions on Electromagnetic Compatibility
Volume58
Issue number2
DOIs
Publication statusPublished - 1 Apr 2016
Externally publishedYes

Keywords

  • Electromagnetic compatibility
  • emission source microscopy
  • far field
  • near-field scan
  • random fields

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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