@inproceedings{f898e752671e4463b354d7f938a96777,
title = "Modeling of the immunity of ICs to EFTs",
abstract = "Investigation of the immunity of ICs to EFTs is increasingly important. In this paper, an accurate model of a microcontroller is developed and verified. This model consists of two parts: a passive Power Distribution Network (PDN) model and an active I/O protection network model. Measurement methods are designed to extract the parameters of the passive PDN model. The accuracy of the overall model of the IC is verified using both S parameter tests and EFT injection tests. The model is able to accurately predict the voltage and current at power-supply and I/O pins and correctly accounts for the active components of the I/O protection network.",
author = "Ji Zhang and Jayong Koo and Beetner, {Daryl G.} and Richard Moseley and Scott Herrin and David Pommerenke",
year = "2010",
month = dec,
day = "1",
doi = "10.1109/ISEMC.2010.5711323",
language = "English",
isbn = "9781424463053",
series = "IEEE International Symposium on Electromagnetic Compatibility",
pages = "484--489",
booktitle = "IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program",
note = "2010 IEEE International Symposium on Electromagnetic Compatibility : EMC 2010 ; Conference date: 25-07-2010 Through 30-07-2010",
}