Modeling of the immunity of ICs to EFTs

Ji Zhang*, Jayong Koo, Daryl G. Beetner, Richard Moseley, Scott Herrin, David Pommerenke

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Investigation of the immunity of ICs to EFTs is increasingly important. In this paper, an accurate model of a microcontroller is developed and verified. This model consists of two parts: a passive Power Distribution Network (PDN) model and an active I/O protection network model. Measurement methods are designed to extract the parameters of the passive PDN model. The accuracy of the overall model of the IC is verified using both S parameter tests and EFT injection tests. The model is able to accurately predict the voltage and current at power-supply and I/O pins and correctly accounts for the active components of the I/O protection network.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program
Pages484-489
Number of pages6
DOIs
Publication statusPublished - 1 Dec 2010
Externally publishedYes
Event2010 IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Fort Lauderdale, FL, United States
Duration: 25 Jul 201030 Jul 2010

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076

Conference

Conference2010 IEEE International Symposium on Electromagnetic Compatibility, EMC 2010
CountryUnited States
CityFort Lauderdale, FL
Period25/07/1030/07/10

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Zhang, J., Koo, J., Beetner, D. G., Moseley, R., Herrin, S., & Pommerenke, D. (2010). Modeling of the immunity of ICs to EFTs. In IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program (pp. 484-489). [5711323] (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2010.5711323