Mode suppressed TEM cell design for high frequency IC measurements

Shaowei Deng*, David Pommerenke, Todd Hubing, James Drewniak, Daryl Beetner, Dongshik Shin, Sungnam Kim, Hocheol Kwak

*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

TEM cells or GTEM cells can be used to evaluate the radiated emissions of integrated circuits (ICs). The applicable frequency bandwidth of a TEM cell is limited due to the resonances of higher order modes. This paper describes how a TEM cell can be modified to extend the frequency range without changing the test topology. Several methods are proposed and implemented to suppress the higher order modes. The magnetic field coupling and electric field coupling are evaluated for the new design. The frequency bandwidth of the modified TEM cell is extended from original 1 GHz to 2.5 GHz.

Originalspracheenglisch
TitelIEEE International Symposium on Electromagnetic Compatibility, EMC 2007
DOIs
PublikationsstatusVeröffentlicht - 1 Dez 2007
Extern publiziertJa
VeranstaltungIEEE International Symposium on Electromagnetic Compatibility, EMC 2007 - Honolulu, HI, USA / Vereinigte Staaten
Dauer: 9 Jul 200713 Jul 2007

Publikationsreihe

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076

Konferenz

KonferenzIEEE International Symposium on Electromagnetic Compatibility, EMC 2007
LandUSA / Vereinigte Staaten
OrtHonolulu, HI
Zeitraum9/07/0713/07/07

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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  • Dieses zitieren

    Deng, S., Pommerenke, D., Hubing, T., Drewniak, J., Beetner, D., Shin, D., ... Kwak, H. (2007). Mode suppressed TEM cell design for high frequency IC measurements. in IEEE International Symposium on Electromagnetic Compatibility, EMC 2007 [4305593] (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2007.13