Mode suppressed TEM cell design for high frequency IC measurements

Shaowei Deng*, David Pommerenke, Todd Hubing, James Drewniak, Daryl Beetner, Dongshik Shin, Sungnam Kim, Hocheol Kwak

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

TEM cells or GTEM cells can be used to evaluate the radiated emissions of integrated circuits (ICs). The applicable frequency bandwidth of a TEM cell is limited due to the resonances of higher order modes. This paper describes how a TEM cell can be modified to extend the frequency range without changing the test topology. Several methods are proposed and implemented to suppress the higher order modes. The magnetic field coupling and electric field coupling are evaluated for the new design. The frequency bandwidth of the modified TEM cell is extended from original 1 GHz to 2.5 GHz.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility, EMC 2007
DOIs
Publication statusPublished - 1 Dec 2007
Externally publishedYes
EventIEEE International Symposium on Electromagnetic Compatibility, EMC 2007 - Honolulu, HI, United States
Duration: 9 Jul 200713 Jul 2007

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076

Conference

ConferenceIEEE International Symposium on Electromagnetic Compatibility, EMC 2007
CountryUnited States
CityHonolulu, HI
Period9/07/0713/07/07

Keywords

  • Higher order mode
  • Radiated emissions
  • TEM cell

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Deng, S., Pommerenke, D., Hubing, T., Drewniak, J., Beetner, D., Shin, D., ... Kwak, H. (2007). Mode suppressed TEM cell design for high frequency IC measurements. In IEEE International Symposium on Electromagnetic Compatibility, EMC 2007 [4305593] (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2007.13