Learning-Based Testing of an Industrial Measurement Device

Bernhard Aichernig, Christian Burghard, Robert Korosec

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings
Herausgeber (Verlag)	Springer
Seiten	1-18
Publikationsstatus	Veröffentlicht - 2019

Name	Lecture Notes in Computer Science
Band	11460

Dieses zitieren

Learning-Based Testing of an Industrial Measurement Device. / Aichernig, Bernhard; Burghard, Christian; Korosec, Robert.
NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings. Springer, 2019. S. 1-18 (Lecture Notes in Computer Science; Band 11460).

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

@inproceedings{aa6e048ed36a4ffb8241f8ac651d6722,

title = "Learning-Based Testing of an Industrial Measurement Device",

author = "Bernhard Aichernig and Christian Burghard and Robert Korosec",

year = "2019",

language = "English",

series = "Lecture Notes in Computer Science",

publisher = "Springer",

pages = "1--18",

booktitle = "NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings",

}

TY - GEN

T1 - Learning-Based Testing of an Industrial Measurement Device

AU - Aichernig, Bernhard

AU - Burghard, Christian

AU - Korosec, Robert

PY - 2019

Y1 - 2019

M3 - Conference paper

T3 - Lecture Notes in Computer Science

SP - 1

EP - 18

BT - NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings

PB - Springer

ER -