Learning-Based Testing of an Industrial Measurement Device

Bernhard Aichernig, Christian Burghard, Robert Korosec

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationNASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings
PublisherSpringer
Pages1-18
Publication statusPublished - 2019

Publication series

NameLecture Notes in Computer Science
Volume11460

Cite this

Aichernig, B., Burghard, C., & Korosec, R. (2019). Learning-Based Testing of an Industrial Measurement Device. In NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings (pp. 1-18). (Lecture Notes in Computer Science; Vol. 11460). Springer.

Learning-Based Testing of an Industrial Measurement Device. / Aichernig, Bernhard; Burghard, Christian; Korosec, Robert.

NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings. Springer, 2019. p. 1-18 (Lecture Notes in Computer Science; Vol. 11460).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Aichernig, B, Burghard, C & Korosec, R 2019, Learning-Based Testing of an Industrial Measurement Device. in NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings. Lecture Notes in Computer Science, vol. 11460, Springer, pp. 1-18.
Aichernig B, Burghard C, Korosec R. Learning-Based Testing of an Industrial Measurement Device. In NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings. Springer. 2019. p. 1-18. (Lecture Notes in Computer Science).
Aichernig, Bernhard ; Burghard, Christian ; Korosec, Robert. / Learning-Based Testing of an Industrial Measurement Device. NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings. Springer, 2019. pp. 1-18 (Lecture Notes in Computer Science).
@inproceedings{aa6e048ed36a4ffb8241f8ac651d6722,
title = "Learning-Based Testing of an Industrial Measurement Device",
author = "Bernhard Aichernig and Christian Burghard and Robert Korosec",
year = "2019",
language = "English",
series = "Lecture Notes in Computer Science",
publisher = "Springer",
pages = "1--18",
booktitle = "NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings",

}

TY - GEN

T1 - Learning-Based Testing of an Industrial Measurement Device

AU - Aichernig, Bernhard

AU - Burghard, Christian

AU - Korosec, Robert

PY - 2019

Y1 - 2019

M3 - Conference contribution

T3 - Lecture Notes in Computer Science

SP - 1

EP - 18

BT - NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings

PB - Springer

ER -