Learning-Based Testing of an Industrial Measurement Device

Bernhard Aichernig, Christian Burghard, Robert Korosec

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationNASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings
PublisherSpringer
Pages1-18
Publication statusPublished - 2019

Publication series

NameLecture Notes in Computer Science
Volume11460

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