Abstract
Structural disorder induced by epitaxial strain relaxation in c-axis oriented [YBa2Cu3O7-x n u.c/PrBa2Cu3O7 5 u.c.] superlattices on (100) SrTiO3 substrates has been analyzed by high-resolution and energy-filtered transmission electron microscopy. Epitaxial strain shows up in ultrathin YBCO layers with thickness below 4 unit cells. Strain relaxation takes place when layer thickness increases above this value. Microscopy observations for epitaxially strained superlattices show a good morphology of the layers, with sharp and flat interfaces. However, in relaxed samples rougher interfaces are observed, together with microdomains showing the c-axis parallel to the substrate plane which preserve the superlattice compositional profile. Such microdomains of c-parallel growth provide a path for reduced lattice mismatch, conforming a very efficient mechanism for strain relaxation.
Originalsprache | englisch |
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Seiten (von - bis) | 558-561 |
Seitenumfang | 4 |
Fachzeitschrift | Journal of Alloys and Compounds |
Jahrgang | 323-324 |
DOIs | |
Publikationsstatus | Veröffentlicht - 12 Juli 2001 |
Extern publiziert | Ja |
Veranstaltung | 4th International Conference on f-Elements - Madrid, Spanien Dauer: 17 Sept. 2000 → 21 Sept. 2000 |
ASJC Scopus subject areas
- Werkstoffmechanik
- Maschinenbau
- Metalle und Legierungen
- Werkstoffchemie