High-resolution and energy-filtered transmission electron microscopy of YBa2Cu3O7-x/PrBa2Cu3 O7 superlattices

M. Varela, C. Ballesteros, W. Grogger, K. M. Krishnan, D. Arias, Z. Sefrioui, C. León, J. Santamaría

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

Structural disorder induced by epitaxial strain relaxation in c-axis oriented [YBa2Cu3O7-x n u.c/PrBa2Cu3O7 5 u.c.] superlattices on (100) SrTiO3 substrates has been analyzed by high-resolution and energy-filtered transmission electron microscopy. Epitaxial strain shows up in ultrathin YBCO layers with thickness below 4 unit cells. Strain relaxation takes place when layer thickness increases above this value. Microscopy observations for epitaxially strained superlattices show a good morphology of the layers, with sharp and flat interfaces. However, in relaxed samples rougher interfaces are observed, together with microdomains showing the c-axis parallel to the substrate plane which preserve the superlattice compositional profile. Such microdomains of c-parallel growth provide a path for reduced lattice mismatch, conforming a very efficient mechanism for strain relaxation.

Original languageEnglish
Pages (from-to)558-561
Number of pages4
JournalJournal of Alloys and Compounds
Volume323-324
DOIs
Publication statusPublished - 12 Jul 2001
Externally publishedYes
Event4th International Conference on f-Elements - Madrid, Spain
Duration: 17 Sep 200021 Sep 2000

Fingerprint

Strain relaxation
Superlattices
Transmission electron microscopy
Lattice mismatch
Substrates
Microscopic examination
barium copper yttrium oxide

Keywords

  • A. high-Tc superconductors
  • A. thin films
  • C. scanning and transmission electron microscopy

ASJC Scopus subject areas

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

Cite this

High-resolution and energy-filtered transmission electron microscopy of YBa2Cu3O7-x/PrBa2Cu3 O7 superlattices. / Varela, M.; Ballesteros, C.; Grogger, W.; Krishnan, K. M.; Arias, D.; Sefrioui, Z.; León, C.; Santamaría, J.

In: Journal of Alloys and Compounds, Vol. 323-324, 12.07.2001, p. 558-561.

Research output: Contribution to journalConference articleResearchpeer-review

Varela, M. ; Ballesteros, C. ; Grogger, W. ; Krishnan, K. M. ; Arias, D. ; Sefrioui, Z. ; León, C. ; Santamaría, J. / High-resolution and energy-filtered transmission electron microscopy of YBa2Cu3O7-x/PrBa2Cu3 O7 superlattices. In: Journal of Alloys and Compounds. 2001 ; Vol. 323-324. pp. 558-561.
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abstract = "Structural disorder induced by epitaxial strain relaxation in c-axis oriented [YBa2Cu3O7-x n u.c/PrBa2Cu3O7 5 u.c.] superlattices on (100) SrTiO3 substrates has been analyzed by high-resolution and energy-filtered transmission electron microscopy. Epitaxial strain shows up in ultrathin YBCO layers with thickness below 4 unit cells. Strain relaxation takes place when layer thickness increases above this value. Microscopy observations for epitaxially strained superlattices show a good morphology of the layers, with sharp and flat interfaces. However, in relaxed samples rougher interfaces are observed, together with microdomains showing the c-axis parallel to the substrate plane which preserve the superlattice compositional profile. Such microdomains of c-parallel growth provide a path for reduced lattice mismatch, conforming a very efficient mechanism for strain relaxation.",
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AU - Varela, M.

AU - Ballesteros, C.

AU - Grogger, W.

AU - Krishnan, K. M.

AU - Arias, D.

AU - Sefrioui, Z.

AU - León, C.

AU - Santamaría, J.

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