FEM-based Computation of circuit parameters for testing fast transients for EMC problems

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Abstract

This contribution outlines the extraction of circuit parameters with 3D finite elements from the standardized electromagnetic compatibility (EMC) measurement setup of the capacitive coupling clamp that is utilized for immunity tests against fast transients.

Originalspracheenglisch
TitelIEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
ISBN (elektronisch)9781509010325
DOIs
PublikationsstatusVeröffentlicht - 12 Jan 2017
Veranstaltung17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016 - Miami, USA / Vereinigte Staaten
Dauer: 13 Nov 201616 Nov 2016

Konferenz

Konferenz17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016
LandUSA / Vereinigte Staaten
OrtMiami
Zeitraum13/11/1616/11/16

Fingerprint

Electromagnetic Compatibility
electromagnetic compatibility
clamps
Clamping devices
immunity
Electromagnetic compatibility
Immunity
Finite Element
Finite element method
Testing
Networks (circuits)

Schlagwörter

    ASJC Scopus subject areas

    • !!Computational Mathematics
    • !!Instrumentation
    • !!Electrical and Electronic Engineering

    Dies zitieren

    Bauer, S., Renhart, W., & Biro, O. (2017). FEM-based Computation of circuit parameters for testing fast transients for EMC problems. in IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation [7816252] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CEFC.2016.7816252

    FEM-based Computation of circuit parameters for testing fast transients for EMC problems. / Bauer, Susanne; Renhart, Werner; Biro, Oszkar.

    IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation. Institute of Electrical and Electronics Engineers, 2017. 7816252.

    Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

    Bauer, S, Renhart, W & Biro, O 2017, FEM-based Computation of circuit parameters for testing fast transients for EMC problems. in IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation., 7816252, Institute of Electrical and Electronics Engineers, Miami, USA / Vereinigte Staaten, 13/11/16. https://doi.org/10.1109/CEFC.2016.7816252
    Bauer S, Renhart W, Biro O. FEM-based Computation of circuit parameters for testing fast transients for EMC problems. in IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation. Institute of Electrical and Electronics Engineers. 2017. 7816252 https://doi.org/10.1109/CEFC.2016.7816252
    Bauer, Susanne ; Renhart, Werner ; Biro, Oszkar. / FEM-based Computation of circuit parameters for testing fast transients for EMC problems. IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation. Institute of Electrical and Electronics Engineers, 2017.
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