FEM-based Computation of circuit parameters for testing fast transients for EMC problems

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Abstract

This contribution outlines the extraction of circuit parameters with 3D finite elements from the standardized electromagnetic compatibility (EMC) measurement setup of the capacitive coupling clamp that is utilized for immunity tests against fast transients.

LanguageEnglish
Title of host publicationIEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)9781509010325
DOIs
StatusPublished - 12 Jan 2017
Event17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016 - Miami, United States
Duration: 13 Nov 201616 Nov 2016

Conference

Conference17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016
CountryUnited States
CityMiami
Period13/11/1616/11/16

Fingerprint

Electromagnetic Compatibility
electromagnetic compatibility
clamps
Clamping devices
immunity
Electromagnetic compatibility
Immunity
Finite Element
Finite element method
Testing
Networks (circuits)

Keywords

  • Eddy currents
  • Electrostatics
  • EMC
  • FEM

ASJC Scopus subject areas

  • Computational Mathematics
  • Instrumentation
  • Electrical and Electronic Engineering

Cite this

Bauer, S., Renhart, W., & Biro, O. (2017). FEM-based Computation of circuit parameters for testing fast transients for EMC problems. In IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation [7816252] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CEFC.2016.7816252

FEM-based Computation of circuit parameters for testing fast transients for EMC problems. / Bauer, Susanne; Renhart, Werner; Biro, Oszkar.

IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation. Institute of Electrical and Electronics Engineers, 2017. 7816252.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Bauer, S, Renhart, W & Biro, O 2017, FEM-based Computation of circuit parameters for testing fast transients for EMC problems. in IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation., 7816252, Institute of Electrical and Electronics Engineers, 17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016, Miami, United States, 13/11/16. https://doi.org/10.1109/CEFC.2016.7816252
Bauer S, Renhart W, Biro O. FEM-based Computation of circuit parameters for testing fast transients for EMC problems. In IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation. Institute of Electrical and Electronics Engineers. 2017. 7816252 https://doi.org/10.1109/CEFC.2016.7816252
Bauer, Susanne ; Renhart, Werner ; Biro, Oszkar. / FEM-based Computation of circuit parameters for testing fast transients for EMC problems. IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation. Institute of Electrical and Electronics Engineers, 2017.
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