FEM-based Computation of circuit parameters for testing fast transients for EMC problems

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Abstract

This contribution outlines the extraction of circuit parameters with 3D finite elements from the standardized electromagnetic compatibility (EMC) measurement setup of the capacitive coupling clamp that is utilized for immunity tests against fast transients.

Original languageEnglish
Title of host publicationIEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)9781509010325
DOIs
Publication statusPublished - 12 Jan 2017
Event17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016 - Miami, United States
Duration: 13 Nov 201616 Nov 2016

Conference

Conference17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016
CountryUnited States
CityMiami
Period13/11/1616/11/16

Keywords

  • Eddy currents
  • Electrostatics
  • EMC
  • FEM

ASJC Scopus subject areas

  • Computational Mathematics
  • Instrumentation
  • Electrical and Electronic Engineering

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  • Cite this

    Bauer, S., Renhart, W., & Biro, O. (2017). FEM-based Computation of circuit parameters for testing fast transients for EMC problems. In IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation [7816252] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CEFC.2016.7816252