Dependence of ESD charge voltage on humidity in data centers: Part III - Estimation of ESD-related risk in data centers using voltage level extrapolation and Chebyshev's inequality

Xu Gao, Atieh Talebzadeh, Mahdi Moradian, Yunan Han, David E. Swenson, David Pommerenke

Publikation: Beitrag in einer Fachzeitschrift › Konferenzartikel › Begutachtung

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Engineering