Dependence of ESD charge voltage on humidity in data centers: Part III - Estimation of ESD-related risk in data centers using voltage level extrapolation and Chebyshev's inequality

Xu Gao; Atieh Talebzadeh; Mahdi Moradian; Yunan Han; David E. Swenson; David Pommerenke

Dependence of ESD charge voltage on humidity in data centers: Part III - Estimation of ESD-related risk in data centers using voltage level extrapolation and Chebyshev's inequality

Xu Gao, Atieh Talebzadeh, Mahdi Moradian, Yunan Han, David E. Swenson, David Pommerenke

Publikation: Beitrag in einer Fachzeitschrift › Konferenzartikel › Begutachtung

Abstract

This paper is the third in a series that investigates the electrostatic discharge (ESD)-related voltages and risks in data centers. This paper analyzes the risk of damage or upset under the following environmental conditions: 45% relative humidity (RH), 25% RH, and 8% RH at 27°C, and 8% RH at 38°C. The main purpose of this study is to evaluate the increase of ESD-related upsets or failures caused by reducing the RH from 25% to 8%. The pattern walking test, random walking test, and extrapolation method described by Moradian et al. (2014) are used in this paper. As the distribution function of the tribo-charging-induced voltage is not directly known, Chebyshev's inequality is used to predict the upper bound for the probability of ESD-related failures.

Originalsprache	englisch
Seiten (von - bis)	49-57
Seitenumfang	9
Fachzeitschrift	ASHRAE Conference-Papers
Jahrgang	121
Publikationsstatus	Veröffentlicht - 1 Jan. 2015
Extern publiziert	Ja
Veranstaltung	2015 ASHRAE Winter Conference - Chicago, USA / Vereinigte Staaten Dauer: 24 Jan. 2015 → 28 Jan. 2015

ASJC Scopus subject areas

Bauwesen
Maschinenbau

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http://www.scopus.com/inward/record.url?scp=84938874461&partnerID=8YFLogxK

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Dependence of ESD charge voltage on humidity in data centers: Part III - Estimation of ESD-related risk in data centers using voltage level extrapolation and Chebyshev's inequality. / Gao, Xu; Talebzadeh, Atieh; Moradian, Mahdi et al.
in: ASHRAE Conference-Papers, Jahrgang 121, 01.01.2015, S. 49-57.

Publikation: Beitrag in einer Fachzeitschrift › Konferenzartikel › Begutachtung

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abstract = "This paper is the third in a series that investigates the electrostatic discharge (ESD)-related voltages and risks in data centers. This paper analyzes the risk of damage or upset under the following environmental conditions: 45% relative humidity (RH), 25% RH, and 8% RH at 27°C, and 8% RH at 38°C. The main purpose of this study is to evaluate the increase of ESD-related upsets or failures caused by reducing the RH from 25% to 8%. The pattern walking test, random walking test, and extrapolation method described by Moradian et al. (2014) are used in this paper. As the distribution function of the tribo-charging-induced voltage is not directly known, Chebyshev's inequality is used to predict the upper bound for the probability of ESD-related failures.",

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T2 - 2015 ASHRAE Winter Conference

AU - Gao, Xu

AU - Talebzadeh, Atieh

AU - Moradian, Mahdi

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AU - Swenson, David E.

AU - Pommerenke, David

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AB - This paper is the third in a series that investigates the electrostatic discharge (ESD)-related voltages and risks in data centers. This paper analyzes the risk of damage or upset under the following environmental conditions: 45% relative humidity (RH), 25% RH, and 8% RH at 27°C, and 8% RH at 38°C. The main purpose of this study is to evaluate the increase of ESD-related upsets or failures caused by reducing the RH from 25% to 8%. The pattern walking test, random walking test, and extrapolation method described by Moradian et al. (2014) are used in this paper. As the distribution function of the tribo-charging-induced voltage is not directly known, Chebyshev's inequality is used to predict the upper bound for the probability of ESD-related failures.

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