Characterization of silicon wafer surfaces by Contact Angle- and AFM-measurements

Thomas Bodner, Andreas Behrendt, Emil Prax, Franz Stelzer, Frank Wiesbrock

Publikation: KonferenzbeitragPosterForschung

Originalspracheenglisch
PublikationsstatusVeröffentlicht - 2010
VeranstaltungAustrian-Slovenian Polymer Meeting ASPM 2010 - Leoben, Austria
Dauer: 8 Sep 201010 Sep 2010

Konferenz

KonferenzAustrian-Slovenian Polymer Meeting ASPM 2010
OrtLeoben, Austria
Zeitraum8/09/1010/09/10

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Dies zitieren

Bodner, T., Behrendt, A., Prax, E., Stelzer, F., & Wiesbrock, F. (2010). Characterization of silicon wafer surfaces by Contact Angle- and AFM-measurements. Postersitzung präsentiert bei Austrian-Slovenian Polymer Meeting ASPM 2010, Leoben, Austria, .

Characterization of silicon wafer surfaces by Contact Angle- and AFM-measurements. / Bodner, Thomas; Behrendt, Andreas; Prax, Emil; Stelzer, Franz; Wiesbrock, Frank.

2010. Postersitzung präsentiert bei Austrian-Slovenian Polymer Meeting ASPM 2010, Leoben, Austria, .

Publikation: KonferenzbeitragPosterForschung

Bodner, T, Behrendt, A, Prax, E, Stelzer, F & Wiesbrock, F 2010, 'Characterization of silicon wafer surfaces by Contact Angle- and AFM-measurements', Leoben, Austria, 8/09/10 - 10/09/10, .
Bodner T, Behrendt A, Prax E, Stelzer F, Wiesbrock F. Characterization of silicon wafer surfaces by Contact Angle- and AFM-measurements. 2010. Postersitzung präsentiert bei Austrian-Slovenian Polymer Meeting ASPM 2010, Leoben, Austria, .
Bodner, Thomas ; Behrendt, Andreas ; Prax, Emil ; Stelzer, Franz ; Wiesbrock, Frank. / Characterization of silicon wafer surfaces by Contact Angle- and AFM-measurements. Postersitzung präsentiert bei Austrian-Slovenian Polymer Meeting ASPM 2010, Leoben, Austria, .
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author = "Thomas Bodner and Andreas Behrendt and Emil Prax and Franz Stelzer and Frank Wiesbrock",
year = "2010",
language = "English",
note = "Austrian-Slovenian Polymer Meeting ASPM 2010 ; Conference date: 08-09-2010 Through 10-09-2010",

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T1 - Characterization of silicon wafer surfaces by Contact Angle- and AFM-measurements

AU - Bodner, Thomas

AU - Behrendt, Andreas

AU - Prax, Emil

AU - Stelzer, Franz

AU - Wiesbrock, Frank

PY - 2010

Y1 - 2010

M3 - Poster

ER -