Characterization of silicon wafer surfaces by Contact Angle- and AFM-measurements

Thomas Bodner, Andreas Behrendt, Emil Prax, Franz Stelzer, Frank Wiesbrock

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2010
EventAustrian-Slovenian Polymer Meeting ASPM 2010 - Leoben, Austria
Duration: 8 Sept 201010 Sept 2010

Conference

ConferenceAustrian-Slovenian Polymer Meeting ASPM 2010
CityLeoben, Austria
Period8/09/1010/09/10

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

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