Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables

R. Heinrich; S. Bönisch; D. Pommerenke; R. Jobava; W. Kalkner

Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables

R. Heinrich^*, S. Bönisch, D. Pommerenke, R. Jobava, W. Kalkner

^*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in einer Fachzeitschrift › Konferenzartikel › Begutachtung

Abstract

The measurement of frequency dependent conductivity and permittivity in semiconducting materials was investigated in the high-voltage cross-linked polyethylene (XLPE) cables. The measurement set up was studied in order to determine the reflection coefficients. The semiconductor sample was analyzed in terms of impedance, calibration, accuracy and temperature control. The temperature dependence of these semiconducting layers of medium and high voltage cables was also reported.

Originalsprache	englisch
Seiten (von - bis)	212-217
Seitenumfang	6
Fachzeitschrift	IEE Conference Publication
Ausgabenummer	473
Publikationsstatus	Veröffentlicht - 1 Jan. 2000
Extern publiziert	Ja
Veranstaltung	8th International Conference on Materials, Measurements and Applications - Edinburgh, UK Dauer: 17 Sept. 2000 → 21 Sept. 2000

ASJC Scopus subject areas

Elektrotechnik und Elektronik

Andere Dateien und Links

http://www.scopus.com/inward/record.url?scp=0034543572&partnerID=8YFLogxK

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title = "Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables",

abstract = "The measurement of frequency dependent conductivity and permittivity in semiconducting materials was investigated in the high-voltage cross-linked polyethylene (XLPE) cables. The measurement set up was studied in order to determine the reflection coefficients. The semiconductor sample was analyzed in terms of impedance, calibration, accuracy and temperature control. The temperature dependence of these semiconducting layers of medium and high voltage cables was also reported.",

author = "R. Heinrich and S. B{\"o}nisch and D. Pommerenke and R. Jobava and W. Kalkner",

year = "2000",

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language = "English",

pages = "212--217",

journal = "IEE Conference Publication",

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note = "8th International Conference on Materials, Measurements and Applications ; Conference date: 17-09-2000 Through 21-09-2000",

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TY - JOUR

T1 - Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables

AU - Heinrich, R.

AU - Bönisch, S.

AU - Pommerenke, D.

AU - Jobava, R.

AU - Kalkner, W.

PY - 2000/1/1

Y1 - 2000/1/1

N2 - The measurement of frequency dependent conductivity and permittivity in semiconducting materials was investigated in the high-voltage cross-linked polyethylene (XLPE) cables. The measurement set up was studied in order to determine the reflection coefficients. The semiconductor sample was analyzed in terms of impedance, calibration, accuracy and temperature control. The temperature dependence of these semiconducting layers of medium and high voltage cables was also reported.

AB - The measurement of frequency dependent conductivity and permittivity in semiconducting materials was investigated in the high-voltage cross-linked polyethylene (XLPE) cables. The measurement set up was studied in order to determine the reflection coefficients. The semiconductor sample was analyzed in terms of impedance, calibration, accuracy and temperature control. The temperature dependence of these semiconducting layers of medium and high voltage cables was also reported.

UR - http://www.scopus.com/inward/record.url?scp=0034543572&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0034543572

SN - 0537-9989

SP - 212

EP - 217

JO - IEE Conference Publication

JF - IEE Conference Publication

IS - 473

T2 - 8th International Conference on Materials, Measurements and Applications

Y2 - 17 September 2000 through 21 September 2000

ER -

Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables

Abstract

ASJC Scopus subject areas

Andere Dateien und Links

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