The measurement of frequency dependent conductivity and permittivity in semiconducting materials was investigated in the high-voltage cross-linked polyethylene (XLPE) cables. The measurement set up was studied in order to determine the reflection coefficients. The semiconductor sample was analyzed in terms of impedance, calibration, accuracy and temperature control. The temperature dependence of these semiconducting layers of medium and high voltage cables was also reported.
|Seiten (von - bis)||212-217|
|Fachzeitschrift||IEE Conference Publication|
|Publikationsstatus||Veröffentlicht - 1 Jan 2000|
|Veranstaltung||8th International Conference on Materials, Measurements and Applications - Edinburgh, UK|
Dauer: 17 Sep 2000 → 21 Sep 2000
ASJC Scopus subject areas
- !!Electrical and Electronic Engineering