Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables

R. Heinrich*, S. Bönisch, D. Pommerenke, R. Jobava, W. Kalkner

*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in einer FachzeitschriftKonferenzartikel

Abstract

The measurement of frequency dependent conductivity and permittivity in semiconducting materials was investigated in the high-voltage cross-linked polyethylene (XLPE) cables. The measurement set up was studied in order to determine the reflection coefficients. The semiconductor sample was analyzed in terms of impedance, calibration, accuracy and temperature control. The temperature dependence of these semiconducting layers of medium and high voltage cables was also reported.

Originalspracheenglisch
Seiten (von - bis)212-217
Seitenumfang6
FachzeitschriftIEE Conference Publication
Ausgabenummer473
PublikationsstatusVeröffentlicht - 1 Jan 2000
Extern publiziertJa
Veranstaltung8th International Conference on Materials, Measurements and Applications - Edinburgh, UK
Dauer: 17 Sep 200021 Sep 2000

ASJC Scopus subject areas

  • !!Electrical and Electronic Engineering

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