Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables

R. Heinrich, S. Bönisch, D. Pommerenke, R. Jobava, W. Kalkner

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

The measurement of frequency dependent conductivity and permittivity in semiconducting materials was investigated in the high-voltage cross-linked polyethylene (XLPE) cables. The measurement set up was studied in order to determine the reflection coefficients. The semiconductor sample was analyzed in terms of impedance, calibration, accuracy and temperature control. The temperature dependence of these semiconducting layers of medium and high voltage cables was also reported.

Original languageEnglish
Pages (from-to)212-217
Number of pages6
JournalIEE Conference Publication
Issue number473
Publication statusPublished - 1 Jan 2000
Externally publishedYes
Event8th International Conference on Materials, Measurements and Applications - Edinburgh, UK
Duration: 17 Sep 200021 Sep 2000

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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