Abstract
The measurement of frequency dependent conductivity and permittivity in semiconducting materials was investigated in the high-voltage cross-linked polyethylene (XLPE) cables. The measurement set up was studied in order to determine the reflection coefficients. The semiconductor sample was analyzed in terms of impedance, calibration, accuracy and temperature control. The temperature dependence of these semiconducting layers of medium and high voltage cables was also reported.
| Original language | English |
|---|---|
| Pages (from-to) | 212-217 |
| Number of pages | 6 |
| Journal | IEE Conference Publication |
| Issue number | 473 |
| Publication status | Published - 1 Jan 2000 |
| Externally published | Yes |
| Event | 8th International Conference on Materials, Measurements and Applications - Edinburgh, UK Duration: 17 Sept 2000 → 21 Sept 2000 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering