Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs

Christoph Kirchsteiger; Johannes Grinschgl; Christoph Trummer; Christian Steger; Reinhold Weiß; Markus Pistauer

doi:10.1109/SYSTEMS.2008.4519044

Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs

Christoph Kirchsteiger, Johannes Grinschgl, Christoph Trummer, Christian Steger, Reinhold Weiß, Markus Pistauer

Institut für Technische Informatik (4480)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	Proceeding of the 2nd Annual IEEE Systems Conference, 2008
Herausgeber (Verlag)	IEEE Systems Council
Seiten	1-8
ISBN (Print)	978-1-424-42149-7
DOIs	https://doi.org/10.1109/SYSTEMS.2008.4519044
Publikationsstatus	Veröffentlicht - 2008
Veranstaltung	Annual IEEE Systems Conference - Montreal, Kanada Dauer: 7 Apr. 2008 → 10 Apr. 2008

Konferenz

Konferenz	Annual IEEE Systems Conference
Land/Gebiet	Kanada
Ort	Montreal
Zeitraum	7/04/08 → 10/04/08

Zugriff auf Dokument

10.1109/SYSTEMS.2008.4519044

Hardware/Software-Codesign
Steger, C., Seifert, C., Stelzer, P., Fiala, G. & Basic, F.
1/01/95 → …
Projekt: Arbeitsgebiet

Dieses zitieren

Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs. / Kirchsteiger, Christoph; Grinschgl, Johannes; Trummer, Christoph et al.
Proceeding of the 2nd Annual IEEE Systems Conference, 2008. IEEE Systems Council, 2008. S. 1-8.

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Kirchsteiger, C, Grinschgl, J, Trummer, C, Steger, C , Weiß, R & Pistauer, M 2008, Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs. in Proceeding of the 2nd Annual IEEE Systems Conference, 2008. IEEE Systems Council, S. 1-8, Annual IEEE Systems Conference, Montreal, Kanada, 7/04/08. https://doi.org/10.1109/SYSTEMS.2008.4519044

@inproceedings{091bff02d8a544c2874d8867168bd47c,

title = "Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs",

author = "Christoph Kirchsteiger and Johannes Grinschgl and Christoph Trummer and Christian Steger and Reinhold Wei{\ss} and Markus Pistauer",

year = "2008",

doi = "10.1109/SYSTEMS.2008.4519044",

language = "English",

isbn = "978-1-424-42149-7",

pages = "1--8",

booktitle = "Proceeding of the 2nd Annual IEEE Systems Conference, 2008",

publisher = "IEEE Systems Council",

note = "Annual IEEE Systems Conference ; Conference date: 07-04-2008 Through 10-04-2008",

}

TY - GEN

T1 - Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs

AU - Kirchsteiger, Christoph

AU - Grinschgl, Johannes

AU - Trummer, Christoph

AU - Steger, Christian

AU - Weiß, Reinhold

AU - Pistauer, Markus

PY - 2008

Y1 - 2008

U2 - 10.1109/SYSTEMS.2008.4519044

DO - 10.1109/SYSTEMS.2008.4519044

M3 - Conference paper

SN - 978-1-424-42149-7

SP - 1

EP - 8

BT - Proceeding of the 2nd Annual IEEE Systems Conference, 2008

PB - IEEE Systems Council

T2 - Annual IEEE Systems Conference

Y2 - 7 April 2008 through 10 April 2008

ER -

Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs

Konferenz

Zugriff auf Dokument

Projekte

Hardware/Software-Codesign

Dieses zitieren