Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs

Christoph Kirchsteiger, Johannes Grinschgl, Christoph Trummer, Christian Steger, Reinhold Weiß, Markus Pistauer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceeding of the 2nd Annual IEEE Systems Conference, 2008
PublisherIEEE Systems Council
Pages1-8
ISBN (Print)978-1-424-42149-7
DOIs
Publication statusPublished - 2008
EventAnnual IEEE Systems Conference - Montreal, Canada
Duration: 7 Apr 200810 Apr 2008

Conference

ConferenceAnnual IEEE Systems Conference
CountryCanada
CityMontreal
Period7/04/0810/04/08

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