Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs

Christoph Kirchsteiger; Johannes Grinschgl; Christoph Trummer; Christian Steger; Reinhold Weiß; Markus Pistauer

doi:10.1109/SYSTEMS.2008.4519044

Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs

Christoph Kirchsteiger, Johannes Grinschgl, Christoph Trummer, Christian Steger, Reinhold Weiß, Markus Pistauer

Institute of Technical Informatics (4480)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceeding of the 2nd Annual IEEE Systems Conference, 2008
Publisher	IEEE Systems Council
Pages	1-8
ISBN (Print)	978-1-424-42149-7
DOIs	https://doi.org/10.1109/SYSTEMS.2008.4519044
Publication status	Published - 2008
Event	Annual IEEE Systems Conference - Montreal, Canada Duration: 7 Apr 2008 → 10 Apr 2008

Conference

Conference	Annual IEEE Systems Conference
Country	Canada
City	Montreal
Period	7/04/08 → 10/04/08

Access to Document

10.1109/SYSTEMS.2008.4519044

1 Active

Hardware/Software-Codesign
Pieber, T. W., Steger, C., Weiß, R., Ulz, T., Schachner, M., Kreiner, C. J., Plank, H., Troyer, M., Gressl, L. A., Seifert, C., Warmer, F., Rech, A., Erb, M., Scherr, F., Kammerer, M., Stelzer, P., Frewein, A., Strasser, A., Lindner, J., Ess, A., Feldbacher, M. & Weissteiner, H.
1/01/95 → …
Project: Research area

Cite this

Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs. / Kirchsteiger, Christoph; Grinschgl, Johannes; Trummer, Christoph; Steger, Christian ; Weiß, Reinhold; Pistauer, Markus.

Proceeding of the 2nd Annual IEEE Systems Conference, 2008. IEEE Systems Council, 2008. p. 1-8.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kirchsteiger, C, Grinschgl, J, Trummer, C, Steger, C , Weiß, R & Pistauer, M 2008, Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs. in Proceeding of the 2nd Annual IEEE Systems Conference, 2008. IEEE Systems Council, pp. 1-8, Annual IEEE Systems Conference, Montreal, Canada, 7/04/08. https://doi.org/10.1109/SYSTEMS.2008.4519044

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AU - Kirchsteiger, Christoph

AU - Grinschgl, Johannes

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AU - Steger, Christian

AU - Weiß, Reinhold

AU - Pistauer, Markus

PY - 2008

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Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs

Conference

Access to Document

Hardware/Software-Codesign

Cite this