Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs

Christoph Kirchsteiger; Johannes Grinschgl; Christoph Trummer; Christian Steger; Reinhold Weiß; Markus Pistauer

doi:10.1109/SYSTEMS.2008.4519044

Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs

Christoph Kirchsteiger, Johannes Grinschgl, Christoph Trummer, Christian Steger, Reinhold Weiß, Markus Pistauer

Institute of Technical Informatics (4480)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Proceeding of the 2nd Annual IEEE Systems Conference, 2008
Publisher	IEEE Systems Council
Pages	1-8
ISBN (Print)	978-1-424-42149-7
DOIs	https://doi.org/10.1109/SYSTEMS.2008.4519044
Publication status	Published - 2008
Event	Annual IEEE Systems Conference - Montreal, Canada Duration: 7 Apr 2008 → 10 Apr 2008

Conference

Conference	Annual IEEE Systems Conference
Country/Territory	Canada
City	Montreal
Period	7/04/08 → 10/04/08

Access to Document

10.1109/SYSTEMS.2008.4519044

Hardware/Software-Codesign
Steger, C., Seifert, C., Stelzer, P., Fiala, G. & Basic, F.
1/01/95 → …
Project: Research area

Cite this

Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs. / Kirchsteiger, Christoph; Grinschgl, Johannes; Trummer, Christoph et al.
Proceeding of the 2nd Annual IEEE Systems Conference, 2008. IEEE Systems Council, 2008. p. 1-8.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Kirchsteiger, C, Grinschgl, J, Trummer, C, Steger, C , Weiß, R & Pistauer, M 2008, Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs. in Proceeding of the 2nd Annual IEEE Systems Conference, 2008. IEEE Systems Council, pp. 1-8, Annual IEEE Systems Conference, Montreal, Canada, 7/04/08. https://doi.org/10.1109/SYSTEMS.2008.4519044

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language = "English",

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AU - Kirchsteiger, Christoph

AU - Grinschgl, Johannes

AU - Trummer, Christoph

AU - Steger, Christian

AU - Weiß, Reinhold

AU - Pistauer, Markus

PY - 2008

Y1 - 2008

U2 - 10.1109/SYSTEMS.2008.4519044

DO - 10.1109/SYSTEMS.2008.4519044

M3 - Conference paper

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BT - Proceeding of the 2nd Annual IEEE Systems Conference, 2008

PB - IEEE Systems Council

T2 - Annual IEEE Systems Conference

Y2 - 7 April 2008 through 10 April 2008

ER -

Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs

Conference

Access to Document

Projects

Hardware/Software-Codesign

Cite this