| Original language | English |
|---|---|
| Title of host publication | Proceeding of the 2nd Annual IEEE Systems Conference, 2008 |
| Publisher | IEEE Systems Council |
| Pages | 1-8 |
| ISBN (Print) | 978-1-424-42149-7 |
| DOIs | |
| Publication status | Published - 2008 |
| Event | Annual IEEE Systems Conference - Montreal, Canada Duration: 7 Apr 2008 → 10 Apr 2008 |
Conference
| Conference | Annual IEEE Systems Conference |
|---|---|
| Country | Canada |
| City | Montreal |
| Period | 7/04/08 → 10/04/08 |
Cite this
Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs. / Kirchsteiger, Christoph; Grinschgl, Johannes; Trummer, Christoph; Steger, Christian; Weiß, Reinhold; Pistauer, Markus.
Proceeding of the 2nd Annual IEEE Systems Conference, 2008. IEEE Systems Council, 2008. p. 1-8.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
}
TY - GEN
T1 - Automatic Test Generation From Semi-formal Specifications for Functional Verification of System-on-Chip Designs
AU - Kirchsteiger, Christoph
AU - Grinschgl, Johannes
AU - Trummer, Christoph
AU - Steger, Christian
AU - Weiß, Reinhold
AU - Pistauer, Markus
PY - 2008
Y1 - 2008
U2 - 10.1109/SYSTEMS.2008.4519044
DO - 10.1109/SYSTEMS.2008.4519044
M3 - Conference contribution
SN - 978-1-424-42149-7
SP - 1
EP - 8
BT - Proceeding of the 2nd Annual IEEE Systems Conference, 2008
PB - IEEE Systems Council
ER -