Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods

Julian Wagner, Mario Schmied, Stefan Mitsche

Publikation: KonferenzbeitragPosterForschung

Originalspracheenglisch
PublikationsstatusVeröffentlicht - 2004
Veranstaltung13th European Microscopy Congress - Antwerpen / Belgien
Dauer: 22 Aug 200427 Aug 2004

Konferenz

Konferenz13th European Microscopy Congress
OrtAntwerpen / Belgien
Zeitraum22/08/0427/08/04

Dies zitieren

Wagner, J., Schmied, M., & Mitsche, S. (2004). Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods. Postersitzung präsentiert bei 13th European Microscopy Congress, Antwerpen / Belgien, .

Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods. / Wagner, Julian; Schmied, Mario; Mitsche, Stefan.

2004. Postersitzung präsentiert bei 13th European Microscopy Congress, Antwerpen / Belgien, .

Publikation: KonferenzbeitragPosterForschung

Wagner J, Schmied M, Mitsche S. Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods. 2004. Postersitzung präsentiert bei 13th European Microscopy Congress, Antwerpen / Belgien, .
Wagner, Julian ; Schmied, Mario ; Mitsche, Stefan. / Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods. Postersitzung präsentiert bei 13th European Microscopy Congress, Antwerpen / Belgien, .
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AU - Mitsche, Stefan

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