| Original language | English |
|---|---|
| Publication status | Published - 2004 |
| Event | 13th European Microscopy Congress - Antwerpen / Belgien Duration: 22 Aug 2004 → 27 Aug 2004 |
Conference
| Conference | 13th European Microscopy Congress |
|---|---|
| City | Antwerpen / Belgien |
| Period | 22/08/04 → 27/08/04 |
Cite this
Wagner, J., Schmied, M., & Mitsche, S. (2004). Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods. Poster session presented at 13th European Microscopy Congress, Antwerpen / Belgien, .
Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods. / Wagner, Julian; Schmied, Mario; Mitsche, Stefan.
2004. Poster session presented at 13th European Microscopy Congress, Antwerpen / Belgien, .Research output: Contribution to conference › Poster › Research
Wagner, J, Schmied, M & Mitsche, S 2004, 'Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods' 13th European Microscopy Congress, Antwerpen / Belgien, 22/08/04 - 27/08/04, .
Wagner J, Schmied M, Mitsche S. Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods. 2004. Poster session presented at 13th European Microscopy Congress, Antwerpen / Belgien, .
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title = "Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods",
author = "Julian Wagner and Mario Schmied and Stefan Mitsche",
year = "2004",
language = "English",
note = "13th European Microscopy Congress ; Conference date: 22-08-2004 Through 27-08-2004",
}
TY - CONF
T1 - Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods
AU - Wagner, Julian
AU - Schmied, Mario
AU - Mitsche, Stefan
PY - 2004
Y1 - 2004
M3 - Poster
ER -