Advanced EMI analysis methods

^*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in einer Fachzeitschrift › Konferenzartikel › Begutachtung

Originalsprache	englisch
Aufsatznummer	4652241
Fachzeitschrift	IEEE International Symposium on Electromagnetic Compatibility
Jahrgang	2008-January
DOIs	https://doi.org/10.1109/ISEMC.2008.4652241
Publikationsstatus	Veröffentlicht - 1 Jan. 2008
Extern publiziert	Ja
Veranstaltung	2008 IEEE International Symposium on Electromagnetic Compatibility: EMC 2008 - Detroit, USA / Vereinigte Staaten Dauer: 18 Aug. 2008 → 22 Aug. 2008

ASJC Scopus subject areas

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