Advanced EMI analysis methods

David Pommerenke*

*Corresponding author for this work

Research output: Contribution to journalConference article

Original languageEnglish
Article number4652241
JournalIEEE International Symposium on Electromagnetic Compatibility
Volume2008-January
DOIs
Publication statusPublished - 1 Jan 2008
Externally publishedYes
Event2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, United States
Duration: 18 Aug 200822 Aug 2008

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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