A Novel Automated NFC Interoperability Test and Debug System

Martin Erb; Christian Steger; Josef Preishuber-Pfluegl; Martin Troyer

A Novel Automated NFC Interoperability Test and Debug System

Martin Erb, Christian Steger, Josef Preishuber-Pfluegl, Martin Troyer

Institut für Technische Informatik (4480)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

In this paper, we present a new system architecture for an automated Near Field Communication (NFC) interoperability test and debug system. The increasing availability of NFC-enabled devices and the resulting amount of NFC applications require new methods for interoperability testing and debugging in order to reduce costs. We combine already existing state-of-the-art interoperability test systems and the know-how of manual debugging methods to develop a new automated NFC interoperability test and debug system architecture. We analyze the main components of state-of-the-art test systems, define new requirements for the new system architecture and evaluated the feasibility. Our new architecture significantly reduces the time and cost of developing and certifying new NFC-enabled devices.

Originalsprache	englisch
Titel	Smart SysTech 2019
Untertitel	European Conference on Smart Objects, Systems and Technologies 2019
Erscheinungsort	Berlin, Offenbach
Herausgeber (Verlag)	VDE Verlag GmbH
Seiten	27-34
Seitenumfang	6
ISBN (elektronisch)	978-380074978-2
ISBN (Print)	978-3-8007-4977-5
Publikationsstatus	Veröffentlicht - 5 Juni 2019
Veranstaltung	European Conference on Smart Objects, Systems and Technologies - Fraunhofer Institute for Factory Operation and Automation IFF, Magdeburg, Deutschland Dauer: 4 Juni 2019 → 5 Juni 2019 http://www.smart-systech.eu/

Publikationsreihe

Name	ITG-Fachbericht
Band	289

Konferenz

Konferenz	European Conference on Smart Objects, Systems and Technologies
Kurztitel	Smart SysTech 2019
Land/Gebiet	Deutschland
Ort	Magdeburg
Zeitraum	4/06/19 → 5/06/19
Internetadresse	http://www.smart-systech.eu/

Fields of Expertise

Information, Communication & Computing

1 Abgeschlossen
1 Laufend

Hardware/Software-Codesign
Steger, C., Seifert, C., Stelzer, P., Fiala, G. & Basic, F.
1/01/95 → …
Projekt: Arbeitsgebiet
ANITAS - Neues NFC Interoperabilitäts-Testautomatisierungssystem
Steger, C., Erb, M. & Troyer, M.
1/01/18 → 30/06/20
Projekt: Forschungsprojekt

A Novel Automated NFC Interoperability Test and Debug System
Martin Erb (Redner/in)
4 Juni 2019 → 5 Juni 2019
Aktivität: Vortrag oder Präsentation › Vortrag bei Konferenz oder Fachtagung › Science to public

Best Paper Award
Erb, Martin (Empfänger/-in), Troyer, Martin (Empfänger/-in), Steger, Christian (Empfänger/-in) & Preishuber-Pflügl, Josef, Dipl.-Ing. (Empfänger/-in), 5 Juni 2019
Auszeichnung: Preise / Medaillen / Ehrungen

Dieses zitieren

A Novel Automated NFC Interoperability Test and Debug System. / Erb, Martin; Steger, Christian; Preishuber-Pfluegl, Josef et al.
Smart SysTech 2019 : European Conference on Smart Objects, Systems and Technologies 2019. Berlin, Offenbach: VDE Verlag GmbH, 2019. S. 27-34 149975 (ITG-Fachbericht; Band 289).

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Erb, M, Steger, C, Preishuber-Pfluegl, J & Troyer, M 2019, A Novel Automated NFC Interoperability Test and Debug System. in Smart SysTech 2019 : European Conference on Smart Objects, Systems and Technologies 2019., 149975, ITG-Fachbericht, Bd. 289, VDE Verlag GmbH, Berlin, Offenbach, S. 27-34, European Conference
on Smart Objects, Systems and Technologies, Magdeburg, Deutschland, 4/06/19.

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title = "A Novel Automated NFC Interoperability Test and Debug System",

abstract = "In this paper, we present a new system architecture for an automated Near Field Communication (NFC) interoperability test and debug system. The increasing availability of NFC-enabled devices and the resulting amount of NFC applications require new methods for interoperability testing and debugging in order to reduce costs. We combine already existing state-of-the-art interoperability test systems and the know-how of manual debugging methods to develop a new automated NFC interoperability test and debug system architecture. We analyze the main components of state-of-the-art test systems, define new requirements for the new system architecture and evaluated the feasibility. Our new architecture significantly reduces the time and cost of developing and certifying new NFC-enabled devices.",

keywords = "NFC, RFID, Interoperability Testing",

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N2 - In this paper, we present a new system architecture for an automated Near Field Communication (NFC) interoperability test and debug system. The increasing availability of NFC-enabled devices and the resulting amount of NFC applications require new methods for interoperability testing and debugging in order to reduce costs. We combine already existing state-of-the-art interoperability test systems and the know-how of manual debugging methods to develop a new automated NFC interoperability test and debug system architecture. We analyze the main components of state-of-the-art test systems, define new requirements for the new system architecture and evaluated the feasibility. Our new architecture significantly reduces the time and cost of developing and certifying new NFC-enabled devices.

AB - In this paper, we present a new system architecture for an automated Near Field Communication (NFC) interoperability test and debug system. The increasing availability of NFC-enabled devices and the resulting amount of NFC applications require new methods for interoperability testing and debugging in order to reduce costs. We combine already existing state-of-the-art interoperability test systems and the know-how of manual debugging methods to develop a new automated NFC interoperability test and debug system architecture. We analyze the main components of state-of-the-art test systems, define new requirements for the new system architecture and evaluated the feasibility. Our new architecture significantly reduces the time and cost of developing and certifying new NFC-enabled devices.

KW - NFC

KW - RFID

KW - Interoperability Testing

M3 - Conference paper

SN - 978-3-8007-4977-5

T3 - ITG-Fachbericht

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EP - 34

BT - Smart SysTech 2019

PB - VDE Verlag GmbH

CY - Berlin, Offenbach

T2 - European Conference<br/>on Smart Objects, Systems and Technologies

Y2 - 4 June 2019 through 5 June 2019

ER -

A Novel Automated NFC Interoperability Test and Debug System

Abstract

Publikationsreihe

Konferenz

Fields of Expertise

Fingerprint

Projekte

Hardware/Software-Codesign

ANITAS - Neues NFC Interoperabilitäts-Testautomatisierungssystem

Aktivitäten

A Novel Automated NFC Interoperability Test and Debug System

Auszeichnungen

Best Paper Award

Dieses zitieren