A Novel Automated NFC Interoperability Test and Debug System

Martin Erb, Christian Steger, Josef Preishuber-Pfluegl, Martin Troyer

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Abstract

In this paper, we present a new system architecture for an automated Near Field Communication (NFC) interoperability test and debug system. The increasing availability of NFC-enabled devices and the resulting amount of NFC applications require new methods for interoperability testing and debugging in order to reduce costs. We combine already existing state-of-the-art interoperability test systems and the know-how of manual debugging methods to develop a new automated NFC interoperability test and debug system architecture. We analyze the main components of state-of-the-art test systems, define new requirements for the new system architecture and evaluated the feasibility. Our new architecture significantly reduces the time and cost of developing and certifying new NFC-enabled devices.
Originalspracheenglisch
TitelSmart SysTech 2019
UntertitelEuropean Conference on Smart Objects, Systems and Technologies 2019
ErscheinungsortBerlin, Offenbach
Herausgeber (Verlag)VDE Verlag GmbH
Seiten27-34
Seitenumfang6
ISBN (elektronisch)978-380074978-2
ISBN (Print)978-3-8007-4977-5
PublikationsstatusVeröffentlicht - 5 Jun 2019
VeranstaltungEuropean Conference
on Smart Objects, Systems and Technologies
- Fraunhofer Institute for Factory Operation and Automation IFF, Magdeburg, Deutschland
Dauer: 4 Jun 20195 Jun 2019
http://www.smart-systech.eu/

Publikationsreihe

NameITG-Fachbericht
Band289

Konferenz

KonferenzEuropean Conference
on Smart Objects, Systems and Technologies
KurztitelSmart SysTech 2019
LandDeutschland
OrtMagdeburg
Zeitraum4/06/195/06/19
Internetadresse

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Schlagwörter

    Fields of Expertise

    • Information, Communication & Computing

    Dieses zitieren

    Erb, M., Steger, C., Preishuber-Pfluegl, J., & Troyer, M. (2019). A Novel Automated NFC Interoperability Test and Debug System. in Smart SysTech 2019 : European Conference on Smart Objects, Systems and Technologies 2019 (S. 27-34). [149975] (ITG-Fachbericht; Band 289). Berlin, Offenbach: VDE Verlag GmbH.