Microanalysis with high detection sensitivity

Projekt: Foschungsprojekt

Beschreibung

Microanalysis with high detection sensitivity by means of wave-length dispersive x-ray spectrometry (WDXS) in a scanning electron microscope (SEM) using the STEM mode. The methodical developments will be applied to characterise materials and nanostructured devices.
StatusAbschlussdatum
Tatsächlicher Beginn/ -es Ende1/07/0831/12/10