Microanalysis with high detection sensitivity

Project: Research project

Description

Microanalysis with high detection sensitivity by means of wave-length dispersive x-ray spectrometry (WDXS) in a scanning electron microscope (SEM) using the STEM mode. The methodical developments will be applied to characterise materials and nanostructured devices.
StatusFinished
Effective start/end date1/07/0831/12/10