Project Details
Description
Microanalysis with high detection sensitivity by means of wave-length dispersive x-ray spectrometry (WDXS) in a scanning electron microscope (SEM) using the STEM mode. The methodical developments will be applied to characterise materials and nanostructured devices.
| Status | Finished |
|---|---|
| Effective start/end date | 1/07/08 → 31/12/10 |
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